Defect analysis system

Details Defect analysis system Defect analysis system

1984-03-22

1984-11-20

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

358106, 364507, G01N 2188

Patent

active

044840810

ABSTRACT:
Disclosed is an apparatus, and a related method, for the automatic detection of defects in manufactured parts, such as turbine blades and the like. The apparatus includes a video camera, a thresholding module to provide a binary image of a frame of video data, a region growing module to define anomalous regions by associating contiguous picture elements indicative of surface anomalies on the part, and defect analysis modules for determining if a rejectable defect exists, based on a comparison between statistics with respect to the anomalous regions and predetermined rejection criteria. Rejection may be based on region size, region shape, or region position and orientation with respect to neighboring regions. Thus, a region may be rejected if it is nearly collinear with another region, even though neither region may itself be characterized as a rejectable region.

REFERENCES:
patent: 3694658 (1972-09-01), Watson et al.
patent: 3729619 (1973-04-01), Laycak et al.
patent: 3795452 (1974-03-01), Bourdelais et al.
patent: 3964830 (1976-06-01), Ikeda et al.
patent: 4002823 (1977-01-01), Van Oosterhout
patent: 4183013 (1980-01-01), Agrawala et al.

Affiliated with

Also associated with

Rating

Defect analysis system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Defect analysis system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Defect analysis system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2190823