Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1997-01-21
1998-12-15
Breneman, R. Bruce
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438716, 438734, 438973, 20419234, H01L 21302
Patent
active
058496386
ABSTRACT:
The present invention includes a method and system to increase the deep trench sidewall surface area in a storage node on a DRAM chip. By tilting the trenches the capacitance is increased without taking up more space on the semiconductor chip.
REFERENCES:
patent: 3943047 (1976-03-01), Cruzan et al.
patent: 4016062 (1977-04-01), Mehta et al.
patent: 4124966 (1978-11-01), Mahoney
patent: 4128765 (1978-12-01), Franks
patent: 4309267 (1982-01-01), Boyd
patent: 4502913 (1985-03-01), Lechaton et al.
patent: 5205902 (1993-04-01), Horton et al.
patent: 5350499 (1994-09-01), Shibaike et al.
Ozaki et al "0.228 um `Trench Cell Tech with Bottle-Shaped Capacitor for 1Gbit DRAMs" IEDM 95, pp. 661-664.
T. Ozaki et al., 0.228 .mu.m.sup.2 Trench Cell Technologies with Bottle-Shaped Capacitor for 1Gbit DRAMSs IEDM 95, pp. 661-664, 1995.
Ho Herbert Lei
Kotecki David Edward
Radens Carl John
Alanko Anita
Breneman R. Bruce
International Business Machines - Corporation
Neff Daryl K.
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