Deconvolution of multiply charged ions

Details Deconvolution of multiply charged ions Deconvolution of multiply charged ions

1998-06-05

2000-08-15

Ham, Seungsook

Radiant energy

Ionic separation or analysis

Methods

250281, H01J 4900, B01D 5944

Patent

active

061040274

ABSTRACT:
Method for identifying low charge, low weight ions with multiple charge states in mass spectrographic analysis. Ions are matched to a charge series by testing peak width, isotope spacing, and isotope ratios, using instrument resolution and information derived from the instrument spectrum. By following these tests erroneous assignment of ions to a series are avoided, providing higher quality data to the user.

REFERENCES:
patent: 5072115 (1991-12-01), Zhou
patent: 5130538 (1992-07-01), Fenn et al.
patent: 5440119 (1995-08-01), Labowsky
patent: 5916747 (1999-06-01), Gilchrist et al.
Kundur, et al., "Blind Image Deconvolution," IEEE Signal Processing Magazine, vol.: 13(3), pp. 43-64, May 1996.

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