Image analysis – Image transformation or preprocessing – Convolution
Reexamination Certificate
2010-01-13
2011-10-18
Hung, Yubin (Department: 2624)
Image analysis
Image transformation or preprocessing
Convolution
C382S274000
Reexamination Certificate
active
08041146
ABSTRACT:
A system and method of image processing employ mathematical deconvolution to estimate the magnitude and location of a target object within an image. Both the nature of internal reflections and the convolution process by which each internal reflection contributes to blurring of the acquired image data may be measured and modeled. In accordance with mathematical deconvolution techniques, the combined effects of these internal reflections may be reduced to the extend that respective contributions of the target object and each individual reflection may be distinguished and quantified.
REFERENCES:
patent: 5627320 (1997-05-01), Moore
Epstein, D.J. The effective thickness in internal reflection spectroscopy, Applied Spectroscopy, vol. 34, No. 2 (1980), pp. 233-235.
Applied Precision, Inc
Hung Yubin
Olympic Patent Works PLLC
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