Decay characteristic measuring apparatus

Details Decay characteristic measuring apparatus Decay characteristic measuring apparatus

1995-08-25

1996-08-20

Willis, Davis L.

Radiant energy

Luminophor irradiation

356318, G01N 2164

Patent

active

055481248

ABSTRACT:
An excitation light beam intensity-modulated and output from a light-sending unit is irradiated on a target measurement object. A scattered light beam or a reaction light beam is detected by a light-receiving unit through a wavelength selector. The light-receiving unit outputs a signal according to the product of a supplied modulation signal and the received light beam. A processing unit acquires data corresponding to the product value for each type of light, and calculates the decay characteristics of the reaction light beam on the basis of the acquisition result. In this manner, with a simple arrangement, the decay time of a fluorescence sample or the like is precisely measured in a wide frequency range.

REFERENCES:
patent: 5323010 (1994-06-01), Gratton et al.
Zhang et al, "Phase-Locked Detection of Fluorescence Lifetime", Rev. Sci. Instrum. vol. 64, No. 9, Sep. 1993, pp. 2531-2540.
Sugeta et al, "Metal-Semiconductor-Metal Photodetector for High-Speed Optoelectronic Circuits", Proceedings of the 11th Conference (1979 International) on Solid State Device, Tokyo, 1979, Japanese Journal of Applied Physics, vol. 19 (1980) Supplement 19-1, pp. 459-464.
Ito et al, "Low Dark Current GaAs Metal-Semiconductor-Metal (MSM) Photodiodes Using WSi.sub.x Contacts", IEEE Journal of Quantum Electronics, vol. QE-22, No. 7, Jul. 1986, pp. 1073-1077.

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