Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate
Reexamination Certificate
2005-01-04
2005-01-04
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Time duration or rate
C700S013000
Reexamination Certificate
active
06839654
ABSTRACT:
An on-chip event timer apparatus including a hardware timer and a debug interface. The hardware timer includes at least an up-counter for counting clocks of a clock signal, a match register for storing a programmable count value, and a comparator for monitoring whether the up-counter's count value matches the count value of the match register. The debug interface includes enable control unit for enabling the up-counter's operation based on a pre-defined relationship between a state of an enabled signal supplied to said up-counter and an internal state of the hardware timer. Additionally, the debug interface may comprise a clock divider connected to the enable control unit to reduce the clock's frequency in accordance with a pre-programmed divider value. Based on the received clock with the reduced clock frequency, the enable control unit adapts the up-counter's processing speed to the reduced clock frequency.
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Barth Frank
Krebs Alexander
Meyer Jens
Röllig René
Advanced Micro Devices , Inc.
Barlow John
Kivlin Noël
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Sun Xiuqin
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