Debris minimization and improved spatial resolution in...

Electric heating – Metal heating – By arc

Reexamination Certificate

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C219S121840, C219S121830

Reexamination Certificate

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07994450

ABSTRACT:
A method and an apparatus of minimizing the deposition of debris onto a sample being ablated. The method comprising the steps of: 1) reducing a laser pulse energy to approximately a threshold level for ablation; and 2) ablating a region of the sample using a multitude of laser pulses, each pulse being sufficiently separated in time to reduce a concentration of ablation products in a gas phase. An apparatus for ablating a region of a sample with a laser beam. The apparatus comprises: 1) a source providing a pulsed laser beam of a certain energy, the source focusing the laser beam on the sample to ablate a region of the sample; and 2) a device for providing a flowing fluid over the region being ablated to remove the ablation products.

REFERENCES:
patent: 3991296 (1976-11-01), Kojima et al.
patent: 4027137 (1977-05-01), Liedtke
patent: 4190759 (1980-02-01), Hongo et al.
patent: 4766009 (1988-08-01), Imura et al.
patent: 4906812 (1990-03-01), Nied et al.
patent: 5043556 (1991-08-01), Aono et al.
patent: 5112328 (1992-05-01), Taboada et al.
patent: 5656186 (1997-08-01), Mourou et al.
patent: 6090507 (2000-07-01), Grenon et al.
patent: 6156461 (2000-12-01), Grenon et al.
patent: 6190836 (2001-02-01), Grenon et al.
patent: 6262390 (2001-07-01), Goland et al.
patent: 6285002 (2001-09-01), Ngoi et al.
patent: 6333485 (2001-12-01), Haight et al.
patent: 6423921 (2002-07-01), Beyer et al.
patent: 6496257 (2002-12-01), Taniguchi et al.
patent: 6621045 (2003-09-01), Liu et al.
MARS: Femtosecond laser mask advanced repair system in manufacturing; Richard Haight, Dennis Hayden, Peter Longo, Timothy Neary, Alfred Wagner; 1999; pp. 3137-3142.

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