Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-05-24
2005-05-24
Raymong, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S522000
Reexamination Certificate
active
06898534
ABSTRACT:
Disclosed are methods, systems, and algorithms for accurately measuring a DC voltage signal (Vin) using a sigma-delta modulator (36). The preferred embodiments disclose determining a fundamental period (Tp) of the pattern noise cycle of sigma-delta modulator output at a given DC input (Vin), and mapping a one-to-one relationship to the ratio of Vinto reference voltage (Vref). Methods, systems, and algorithms according to the invention include the conversion of a DC input (Vin) into a digital bitstream that periodically provides low-resolution high-frequency digital words (D1) representative of the DC input (Vin). The low-resolution high-frequency words (D1) are in turn periodically converted into high-resolution low-frequency words (D2) representative of the DC input (Vin). A fundamental pattern noise frequency (Ff) of modulator at DC input (Vin) is determined, and a DC measurement result (D3) is output at intervals (1/fh) equal to an integer multiple of the fundamental pattern noise cycle (1/Ff) by taking the sum of the high-resolution low-frequency words (D2) at such intervals (1/fh). Embodiments of the invention are disclosed in which the measurements results (D3) have an error level less than or equal to a selected relative error level (Er).
REFERENCES:
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patent: 6101864 (2000-08-01), Abrams et al.
patent: 6462689 (2002-10-01), Wong et al.
patent: 20040225465 (2004-11-01), Pramanick et al.
Brady III Wade James
Neerings Ronald O.
Raymong Edward
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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