Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate
2011-08-09
2011-08-09
Stark, Jarrett J (Department: 2823)
Semiconductor device manufacturing: process
Including control responsive to sensed condition
Electrical characteristic sensed
C438S005000, C438S016000, C438S017000, C438S018000, C257SE21528
Reexamination Certificate
active
07993937
ABSTRACT:
The invention can provide apparatus and methods for processing substrates and/or wafers in real-time using at least one Direct Current (DC)/Radio Frequency (RF) Hybrid (DC/RFH) processing system and associated Direct Current/Radio Frequency Hybrid (DC/RFH) procedures and DC/RFH process parameters and/or DC/RFH models.
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Chen Lee
Funk Merritt
Stark Jarrett J
Tokyo Electron Limited
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