Daughter ion spectra with time-of-flight mass spectrometers

Details Daughter ion spectra with time-of-flight mass spectrometers Daughter ion spectra with time-of-flight mass spectrometers

2007-11-27

2007-11-27

Vanore, David A. (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

Reexamination Certificate

active

11229047

ABSTRACT:
The invention relates to methods and devices for measuring daughter ion spectra (also called fragment ion spectra or MS/MS spectra) in time-of-flight mass spectrometers with orthogonal injection of the ions. The invention filters the parent ions selected to be fragmented by a mass filter before they are injected into the time-of-flight mass spectrometer, fragments the selected ions in a first stage of the time-of-flight mass spectrometer within a collision cell filled with collision gas at collision energies between one and five kiloelectron-volts, further accelerates the fragment ions and measures the fragment ions in a second stage of the time-of-flight mass spectrometer.

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