Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-05-13
2008-05-13
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C369S126000
Reexamination Certificate
active
10660297
ABSTRACT:
The present invention includes a data storage device and a method of reading data in a data storage device. Accordingly, a first aspect of the present invention is a data storage device. The data storage device includes a probe tip mounted on a suspension mechanism, a data storage layer, at least one conducting layer wherein a capacitance is formed between the suspension mechanism and the at least one conducting layer and a sensor for sensing a change in the capacitance based on a displacement of the probe tip due to the presence of a bit.
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Gibson Gary A.
Pearson James W.
Walmsley Robert
Barlow John
Bhat Aditya S.
Hewlett--Packard Development Company, L.P.
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