Data representation relating to a non-sampled workpiece

Details Data representation relating to a non-sampled workpiece Data representation relating to a non-sampled workpiece

2007-06-26

2007-06-26

Picard, Leo (Department: 2125)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S108000, C702S182000

Reexamination Certificate

active

11224388

ABSTRACT:
A method, apparatus, and a system for providing data representation associated with non-sampled workpieces. Measured metrology data relating to a first workpiece is received. Metrology data corresponding to a second workpiece is approximated based upon the metrology data relating to the first workpiece to provide a projected metrology data relating to the second workpiece.

REFERENCES:
patent: 6790686 (2004-09-01), Purdy et al.
patent: 6834213 (2004-12-01), Sonderman et al.
patent: 6937914 (2005-08-01), Bode et al.
patent: 6957120 (2005-10-01), Bode et al.
patent: 2004/0029299 (2004-02-01), Pasadyn et al.

Affiliated with

Also associated with

Rating

Data representation relating to a non-sampled workpiece does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Data representation relating to a non-sampled workpiece, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Data representation relating to a non-sampled workpiece will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3827955