Data processor test mode access method

Details Data processor test mode access method Data processor test mode access method

1989-11-03

1992-08-25

Lee, Thomas C.

Boots, shoes, and leggings

3642596, 3642608, 3642633, 3642645, 364DIG1, 371 151, 395575, G06F 1122

Patent

active

051426889

ABSTRACT:
A data processor has a test mode which may be selectively accessed for either production testing of the processor or user testing from an external control signal. To enter the test mode, both an external signal applied to an integrated circuit package pin of the data processor and a register bit must be asserted. If only the register bit is asserted, the special mode cannot be entered until the data processor has been reset again.

REFERENCES:
patent: 4359771 (1982-11-01), Johnson et al.
patent: 4580246 (1986-04-01), Sibigtroth
patent: 4669059 (1987-05-01), Little et al.
patent: 4796235 (1989-01-01), Sparks et al.
patent: 5012180 (1991-04-01), Dalrymple et al.

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