Data processing system for performing a test function and method

Details Data processing system for performing a test function and method Data processing system for performing a test function and method

1997-03-03

1998-10-27

Beausoliel, Jr., Robert W.

Electric lamp and discharge devices: systems

Plural diverse-type load devices

Electric discharge device load

371 2231, G06F 1127

Patent

active

058288279

ABSTRACT:
Circuitry is implemented within an integrated circuit ("chip") (101) which is an IEEE 1149.1 compliant device capable of performing JTAG testing (104), such as an EXTEST or CLAMP testing procedure. Upon exiting of either of these procedures, the input/output pins (210) of the chip are placed in a known state, which may be a high impedance state.

REFERENCES:
patent: 4703484 (1987-10-01), Rolfe et al.
patent: 5260948 (1993-11-01), Simpson et al.
patent: 5260950 (1993-11-01), Simpson et al.
patent: 5319646 (1994-06-01), Simpson et al.
patent: 5347520 (1994-09-01), Simpson et al.
patent: 5473617 (1995-12-01), Farwell

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