Data processing system and method included within an...

Details Data processing system and method included within an... Data processing system and method included within an...

2005-01-18

2005-01-18

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S066000, C702S067000, C702S070000

Reexamination Certificate

active

06845331

ABSTRACT:
A data processing system and method included within an oscilloscope for independently analyzing a signal input into the oscilloscope. The oscilloscope includes a plurality of triggering modes. A plurality of trigger parameters are specified for each of the triggering modes. Thereafter, the oscilloscope automatically analyzes the input signal, independently from any user input, utilizing each of the triggering modes and the trigger parameters specified for each of the triggering modes. The input signal includes a desired waveform and a plurality of undesired waveforms. While the oscilloscope is automatically analyzing the input signal, a determination is made regarding whether the oscilloscope triggered on one of the undesired waveforms. When it is determined that the oscilloscope triggered on one of the undesired waveforms, the undesired waveform upon which the oscilloscope triggered is stored.

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