Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-06-21
2005-06-21
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C250S340000
Reexamination Certificate
active
06909981
ABSTRACT:
One embodiment of the invention is directed to a method of processing a plurality of spectra. The method includes receiving values associated with a plurality of sample spots on one or more sample chips, wherein the values were entered using graphic elements representing the sample spots, the graphic elements being displayed on a graphical user interface. Data representing a plurality of signals are received. Each signal in the plurality of signals is annotated with a set of values associated with the sample spot from which the signal is generated.
REFERENCES:
patent: 6225047 (2001-05-01), Hutchens et al.
patent: 6584413 (2003-06-01), Keenan et al.
patent: 6675104 (2004-01-01), Paulse et al.
patent: 2002/0054704 (2002-05-01), Smilansky et al.
patent: 2002/0072982 (2002-06-01), Barton et al.
Enderwick Cynthia
Gavin Edward J.
Ho Patrick
Thomsen Niels Kirk
Ciphergen Biosystems Inc.
Hoff Marc S.
Raymond Edward
LandOfFree
Data management system and method for processing signals... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Data management system and method for processing signals..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Data management system and method for processing signals... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3518195