Data management system and method for processing signals...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C250S340000

Reexamination Certificate

active

06909981

ABSTRACT:
One embodiment of the invention is directed to a method of processing a plurality of spectra. The method includes receiving values associated with a plurality of sample spots on one or more sample chips, wherein the values were entered using graphic elements representing the sample spots, the graphic elements being displayed on a graphical user interface. Data representing a plurality of signals are received. Each signal in the plurality of signals is annotated with a set of values associated with the sample spot from which the signal is generated.

REFERENCES:
patent: 6225047 (2001-05-01), Hutchens et al.
patent: 6584413 (2003-06-01), Keenan et al.
patent: 6675104 (2004-01-01), Paulse et al.
patent: 2002/0054704 (2002-05-01), Smilansky et al.
patent: 2002/0072982 (2002-06-01), Barton et al.

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