Data-dependent jitter (DDJ) calibration methodology

Data processing: measuring – calibrating – or testing – Calibration or correction system – Signal frequency or phase correction

Reexamination Certificate

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Reexamination Certificate

active

11269146

ABSTRACT:
The present subject matter relates to methodologies for providing error correction compensation to measurement systems. Data-dependant jitter may be compensated by examining both short-term and long-term bit histories after applying a predetermined synthesized calibration pattern having selected characteristics to the measurement system. Neural networks may be provided to produce error correction signals that may be applied to measured data on a bit-by-bit basis to correct jitter. The synthesized calibration sequence may correspond to a base pattern having two segments; a first segment may correspond to a copy of the base pattern while the second segment may be a copy of the base pattern with some sections inverted.

REFERENCES:
patent: 2004/0136450 (2004-07-01), Guenther
patent: 2005/0177758 (2005-08-01), Stickle
patent: 2006/0047450 (2006-03-01), Tabatabaei et al.

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