Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-04-18
2006-04-18
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07031870
ABSTRACT:
In a method for evaluating one or more components in a data center, inlet and outlet temperatures of one or more heat dissipating devices are detected. In addition, the temperatures of air supplied by one or more computer room air conditioning (CRAC) units are also detected. Indices of air re-circulation for the one or more heat dissipating devices are calculated based upon the detected inlet temperatures, outlet temperatures and supplied air temperatures. The indices of air re-circulation are determined at various flow field settings of air delivered to the one or more heat dissipating devices and the one or more components are evaluated based upon changes in the indices of air re-circulation for the one or more heat dissipating devices at the various flow field settings.
REFERENCES:
patent: 2003/0139894 (2003-07-01), Ryan et al.
patent: 2005/0187664 (2005-08-01), Bash et al.
patent: 2005/0228618 (2005-10-01), Patel et al.
Bash Cullen E.
Patel Chandrakant D.
Sharma Ratnesh K.
Hewlett--Packard Development Company, L.P.
Lange Richard P.
Pretlow Demetrius R.
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