Data analysis systems and related methods

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement

Reexamination Certificate

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Reexamination Certificate

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07957932

ABSTRACT:
Data analysis systems and related methods. An implementation of a first method of generating one or more bar plots for evaluating the performance of a process may include generating a plurality of breakpoints using historical data values from a process and generating one or more bar plots for an independent or a dependent variable and distributing the plurality of breakpoints along the one or more bar plots. The method may also include retrieving one or more current data values from the process, plotting at least one indicator at a position along the one or more bar plots using the one or more current data values, and indicating the desirability of the position of the at least one indicator relative to the plurality of breakpoints.

REFERENCES:
patent: 5546516 (1996-08-01), Austel et al.
patent: 5694524 (1997-12-01), Evans
patent: 5850339 (1998-12-01), Giles
patent: 6098063 (2000-08-01), Xie et al.
patent: 6110109 (2000-08-01), Hu et al.
patent: 6507832 (2003-01-01), Evans et al.
patent: 6539392 (2003-03-01), Rebane
patent: 6687558 (2004-02-01), Tuszynski
patent: 7286959 (2007-10-01), Steinke
patent: 2001/0041995 (2001-11-01), Eder
patent: 2002/0091609 (2002-07-01), Markowski
patent: 2002/0103688 (2002-08-01), Schneider
patent: 2002/0152148 (2002-10-01), Ebert
patent: 2003/0004903 (2003-01-01), Kehder et al.
patent: 2003/0050048 (2003-03-01), Abed et al.
patent: 2003/0050814 (2003-03-01), Stoneking et al.
patent: 2004/0064353 (2004-04-01), Kim et al.
patent: 2004/0122860 (2004-06-01), Srinivasan
patent: 2005/0192963 (2005-09-01), Tschiegg et al.

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