Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-06-19
2007-06-19
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S138000, C702S156000
Reexamination Certificate
active
10728672
ABSTRACT:
A system for data acquisition providing dual monitoring of sensor data. Data is acquired from sensing devices by a primary data acquisition circuit and a secondary data acquisition circuit. Multiple sensors are used to sense a condition of the same operating parameters, in order to verify a process condition. Data acquired by first and second sensing devices are respectively processed by the primary and secondary data acquisition circuits. According to one aspect of the present invention, a process condition is verified by comparing data associated with the first sensing device and data associated with the second sensing device. In accordance with another aspect of the present invention data acquired by a single sensing device may be processed through both the primary data acquisition circuit and the secondary data acquisition circuit, in order to verify operation of the primary and secondary data acquisition circuits.
REFERENCES:
patent: 5965819 (1999-10-01), Piety et al.
patent: 2004/0128099 (2004-07-01), Summers et al.
Halstead Eric
Theriault Yves-Andre
Barlow John
Centanni Michael A.
Kusner & Jaffe
Steris Inc.
Washburn Douglas N
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