Radiant energy – Ionic separation or analysis – Methods
Reexamination Certificate
2008-11-26
2011-11-22
Maskell, Michael (Department: 2881)
Radiant energy
Ionic separation or analysis
Methods
C250S281000, C250S287000
Reexamination Certificate
active
08063360
ABSTRACT:
A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector, an initial processing module, and a spectra processing module. The initial processing module is provided for processing the ion detection signals and for supplying processed signals to the spectra processing module. The spectra processing module generates spectra from the processed signals and supplies the generated spectra to an external processor for post-processing. The spectra processing module may include one or more of: a cross-spectra filter for filtering data in each spectra as a function of data in at least one prior spectra; a shaping filter for removing skew and shoulders from the processed signals; a sharpening filter for sharpening the peaks of the processed signals to effectively deconvolve and separate overlapping peaks; an ion statistics filter; and a peak histogram filtering circuit.
REFERENCES:
patent: 3634683 (1972-01-01), Bakker
patent: 3832642 (1974-08-01), Helgeland
patent: 3870881 (1975-03-01), Halliday et al.
patent: 3916187 (1975-10-01), Fletcher et al.
patent: 3920987 (1975-11-01), Anbar et al.
patent: 4209784 (1980-06-01), Sumner et al.
patent: 4458149 (1984-07-01), Muga
patent: 4472631 (1984-09-01), Enke et al.
patent: 4490806 (1984-12-01), Enke et al.
patent: 4686365 (1987-08-01), Meek et al.
patent: 4970390 (1990-11-01), Szymczak
patent: 5032722 (1991-07-01), Boesl et al.
patent: 5073713 (1991-12-01), Smith et al.
patent: 5078135 (1992-01-01), Caprioli
patent: 5144127 (1992-09-01), Williams et al.
patent: 5175430 (1992-12-01), Enke et al.
patent: 5194731 (1993-03-01), Turner
patent: 5196708 (1993-03-01), Mullock
patent: 5367162 (1994-11-01), Holland et al.
patent: 5396065 (1995-03-01), Myerholtz et al.
patent: 5463219 (1995-10-01), Buckley et al.
patent: 5712480 (1998-01-01), Mason
patent: 5770857 (1998-06-01), Fuerstenau et al.
patent: 5880973 (1999-03-01), Gray et al.
patent: 6487523 (2002-11-01), Jarman et al.
patent: 6680476 (2004-01-01), Hidalgo et al.
patent: 6765199 (2004-07-01), Youngquist et al.
patent: 6983213 (2006-01-01), Wang
patent: 7196324 (2007-03-01), Verentchikov
patent: 7326925 (2008-02-01), Verentchikov
patent: 7493225 (2009-02-01), Wang et al.
patent: 2006/0122814 (2006-06-01), Beens et al.
patent: 2007/0029473 (2007-02-01), Verentchikov
patent: 2007/0063139 (2007-03-01), Hall et al.
patent: 2007/0158542 (2007-07-01), Bauer et al.
patent: 2007/0158545 (2007-07-01), Verentchikov
patent: 2007/0176090 (2007-08-01), Verentchikov
patent: 2007/0231207 (2007-10-01), Mason
patent: 2008/0001079 (2008-01-01), Wang et al.
patent: 2009/0294645 (2009-12-01), Gorenstein et al.
patent: 2010/0187414 (2010-07-01), Gorenstein et al.
patent: 2274197 (1994-07-01), None
patent: WO 91/03071 (1991-03-01), None
Coles, et al., “Orthogonal Acceleration Time-of-Flight Mass Spectrometry: Improved Sensitivity and Resolution with Gaseous Ion Sources,” The 40thASMS Conf. on Mass Spectrometry and Allied Topics, pp. 10-11, May 31-Jun. 2, 1992.
Dodonov, et al., “Electrospray Ionization on a Reflecting Time-of-Flight Mass Spectrometer,” Institute of Energy Problems of Chemical Physics, Russian Academy of Sciences, Time-of-Flight Mass Spectrometery, ACS Symposium Series 549, pp. 108-123, 1994.
Pinkston et al., “New time-of-flight mass spectrometer for improved mass resolution, versatility, and mass spectrometry/mass spectrometry studies,” Rev. Sci. Instrum, vol. 57 (No. 4), pp. 583-592 (Apr. 1986).
Bakker, J.M.B., “A beam-modulated time-of-flight mass spectrometer Part 1: theoretical considerations,” Journal of Physics E: Scientific Instruments, vol. 6 ( No. 8), p. 785-789, (Aug. 1, 1973).
Bakker, J.M.B., et al., “A beam-modulated time-of-flight mass spectrometer Part II: experimental work,” Journal of Physics E: Scientific Instruments, vol. 7 ( No. 5), p. 321-412, (May 1, 1974).
Bakker, J.M.B., “The time-focusing principle: a double-focusing desing for time-of-flight mass spectrometers,” Int. J. Mass Spectrom. Ion Phys., Elsevier Publishing Co. (Amsterdam, the Netherlands), vol. 7 ( No. 3/4), p. 291-295, (Feb. 16, 1971).
Benninghoven, A., et al., “Secondary Ion Mass Spectrometry: A New Analytical Technique for Biologically Important Compounds,” Organic Mass Spectrometry, vol. 12 ( No. 9), p. 595-597, (May 1, 1977).
Bergmann, T., et al., “High-resolution time-of-flight mass spectrometer,” Rev. Sci. Instrum. , vol. 60 ( No. 4), p. 792-793, (Apr. 1, 1989).
Boesl, U., et al., “A High-Resolution Time-of-Flight Mass Spectrometer with Laser Desorption and a Laser Ionization Source,” Analytical Instrumentation, vol. 16 ( No. 1), p. 151-171, (Jan. 1, 1987).
Boyle, J. G., et al., “Time-of-Flight Mass Spectrometry with an Electrospray Ion Beam,” Anal. Chem., p. 2084-2089, (Sep. 15, 1992).
Cameron, A.E., et al., “An Ion 'Velocitron',” The Review of Scientific Instruments, vol. 19 ( No. 9), p. 605-607, (Sep. 1, 1948).
Coles, J., et al., “Orthogonal acceleration Time-of-Flight Mass Spectrometry: Improved Sensitivity and Resolution with Gaseous Ion Sources,” The 40th ASMS Conf. on Mass Specctrometry and Topics, p. 10-11.
Dawson, J.H.J, et al., “Orthogonal-acceleration Time-of-flight Mass Spectrometer,” Rapid Communication in Mass Spectrometry, vol. 3 ( No. 5), p. 155-159, (Jan. 1, 1989).
De Heer, W.A., et al., “Large ion volume time-of-flight mass spectrometer with position- and velocity-sensitive detection capabilities for cluster beams,” Rev. Sci. Instrum., vol. 62 ( No. 3), p. 670-677, (Mar. 1, 1991).
Di Valentin, M.A., et al., “Satellite mass Peaks in Time-of-Flight Mass Spectrometry of Ions continuously Sampled From an External Source,” Int. Journal of Mass Spec. And Ion Physics, p. 359-366, (Jan. 1, 1973).
Dodonov, A.F., et al. (Ed. Robert J. Cotter), “Electrospray Ionization on a Reflecting Time-of-Flight Mass Spectrometer,” Institute of Energy Problems of Chemical Physics, Russian Academy of Sciences, Time-of-Flight Mass Spectrometry, ACS Symposium Series 549, p. 108-123.
Fowler, T.K, et al., “A Theory on Obtaining Short Bursts of Ions from a Beam of Ions,” Nuclear Instruments and Methods, p. 245-244, (Feb. 7, 1960).
Futrell, J.H., et al., “Modifications of a Time-of-Flight Mass Spectrometer for Investigation of Ion-Molecule Reactions at Elevated Pressures,” The Review of Scientific Instruments, vol. 39 ( No. 3), p. 340-345, (Mar. 1, 1968).
Gohl, W., et al., “Time-of-Flight Mass Spectrometry for ions of Large Energy Spread,” International Journal of Mass Spectropmetry and Ion Physics, p. 411-414, (Jan. 1, 1983).
L.W. Green, et al., “Fast-Pulse Detection for Isotopic Abundance Determination by Resonance Ionization, Time-of-Flight Mass Spectrometry,” Analytical Instrumentation, vol. 17 ( No. 1&2), p. 195-214, (Jan. 1, 1988).
R. Grix, et al., “A Time-of-flight Mass Analyzer with High Resolving Power,” Physikalisches Institut der Justus-Liebig-Universitat, p. 1-3, (Mar. 18, 1988).
J.F. Holland, et al., “Design, construction, and evaluation of an integrating transient recorder for data acquisition in capillary gas chromatography / time-of-flight mass spectrometry,” Rev. Sci. Instrum. , vol. 62 ( No. 1), p. 69-76, (Jan. 1, 1991).
R.S. Houk, et al., “Mass Spectrometry of Inductively Coupled Plasmas,” Analytical Chemistry, vol. 58 ( No. 1), p. 97-105, (Jan. 1, 1986).
R.S. Houk, et al., “Inductively Coupled Argon Plasma as an Ion Source for Mass Spectrometric Determination of Trace Elements,” Analytical Chemistry, vol. 52 ( No. 14), p. 2283-2289, (Dec. 1, 1980).
A.M. Hudor, “Fast electronics for time-of-flight measurements,” Rev. Sci. Instrum. , vol. 52 ( No. 6), p. 819-824, (Jun. 1, 1981).
M. Karas, et al., “UV Laser Matrix Desportion / Ionization Mass Spectrometry of P
Artaev Viatcheslav B.
Mason Michael C.
Pitz Julie R.
Wheeler Mark R.
Willis Peter M.
Leco Corporation
Maskell Michael
Price Heneveld LLP
LandOfFree
Data acquisition system for a spectrometer using various... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Data acquisition system for a spectrometer using various..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Data acquisition system for a spectrometer using various... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4256054