Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2008-04-29
2008-04-29
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S237100
Reexamination Certificate
active
11004492
ABSTRACT:
To further isolate the scattered light112of a specific particle from the scattered light of a different particle, a pin hole device116can be used. The pin hole device116prevents unfocused light from other particles from entering the second plane118, thus isolating a desired, focused image of one particle110of the sample106. In one embodiment, the pin hole116has a size of several microns. At the second plane118, a traditional imaging detection device120detects the defocused light. The position of the second image plane118is chosen for good angular resolution of the scattered light112, and at the same time gives enough light for the imaging detection device120to obtain a sufficient reading.
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Tang Yongchun
Wu Sheng
California Institute of Technology
Lauchman Layla G.
Tope-McKay & Associates
Underwood Jarreas
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