X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2008-08-22
2010-11-16
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S098800, C378S098120, C250S370090
Reexamination Certificate
active
07832928
ABSTRACT:
A method of forming an offset-corrected exposure image includes obtaining an initial exposure image and exposure metadata related to the initial exposure image. An intermediate offset-corrected exposure image is formed by obtaining one or more dark images associated with the initial exposure image and subtracting an averaged value of the one or more dark images from the initial exposure image. The offset-corrected exposure image is obtained by combining an offset adjustment map with the intermediate offset-corrected exposure image.
REFERENCES:
patent: 5046118 (1991-09-01), Ajewole et al.
patent: 5877501 (1999-03-01), Ivan et al.
patent: 6144408 (2000-11-01), MacLean
patent: 6265720 (2001-07-01), Yamazaki et al.
patent: 6497511 (2002-12-01), Schmitt et al.
patent: 6904126 (2005-06-01), Endo
patent: 6919568 (2005-07-01), Odogba et al.
patent: 6937772 (2005-08-01), Gindele
patent: 7006599 (2006-02-01), Okamura et al.
patent: 7026608 (2006-04-01), Hirai
patent: 7092017 (2006-08-01), Kelly et al.
patent: 7113565 (2006-09-01), Endo
patent: 7208717 (2007-04-01), Partain et al.
patent: 7330208 (2008-02-01), Compton et al.
patent: 7381964 (2008-06-01), Kump et al.
patent: 7399974 (2008-07-01), Spahn
patent: 7421063 (2008-09-01), Takenaka et al.
patent: 7553081 (2009-06-01), Ritter et al.
patent: 7729527 (2010-06-01), Maschauer et al.
patent: 2003/0223539 (2003-12-01), Granfors et al.
patent: 2004/0146189 (2004-07-01), Langan
patent: 2007/0065038 (2007-03-01), Maschauer et al.
patent: 2007/0102643 (2007-05-01), Liu et al.
patent: 2008/0094490 (2008-04-01), Compton et al.
patent: 10 2005 043 048 (2007-03-01), None
patent: WO 83/00970 (1983-03-01), None
patent: WO 2007/110798 (2007-10-01), None
Seibert et al., “Flat-filed correction technique for digital detectors,” Proc. SPIE, vol. 3336, 1998, pp. 348-354.
Moy et al., “How does real offset and gain correction affect the DQE in images from X-ray Flat detectors,” Proc. SPIE, 3659, 1999, pp. 90-97.
Wischmann et al., “Correction of Amplifier Non-Linearity, Offset, Gain, Temporal Artifacts, and Defects for Flat Panel Digital Imaging Devices,” Proc. SPIE, vol. 4682, 2002, pp. 427-437.
Streeter, Robert A.,Technology and applications of amorphous silicon, Berlin: Springer Verlag: 1999, Chapter 4.
Roos et al., “Multiple gain ranging readout method to extend the dynamic range of amorphous silicon flat panel imagers,” Proc. SPIE, vol. 5368, 2004, pp. 139-149.
Rodricks et al., “Filtered gain calibration and its effect on DQE and image quality in digital imaging systems,” Proc. SPIE, vol. 3977, pp. 476-485.
Couwenhoven et al., “Enhancement method that provides direct and independent control of fundamental attributes of image quality for radiographyic imagery,” SPIE, vol. 5367, 2004, pp. 474-481.
Schmidgunst et al., “Calibration model of a dual gain flat panel detector for 2D and 3D x-ray imaging,” Med. Phys., 34 (9), 2007,pp. 3649-3664.
DeHority John W.
Scott Richard T.
Topfer Karin
Carestream Health Inc.
Ho Allen C.
LandOfFree
Dark correction for digital X-ray detector does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dark correction for digital X-ray detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dark correction for digital X-ray detector will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4251497