Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-03-06
2007-03-06
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S056000, C702S041000, C073S579000
Reexamination Certificate
active
11088154
ABSTRACT:
Apparatus, systems, and methods are disclosed to solve an equation associated with a structure of the form {−ω2MR+iωBR+[(1+iγ)KR+i(K4R)]}Y=FR, wherein ω is a time-harmonic excitation frequency, MRis a reduced form of a symmetric mass matrix M, BRis a reduced form of a viscous damping matrix B, γ is a scalar global structural damping coefficient, KRis a reduced form of a symmetric stiffness matrix K, K4Ris a reduced form of a symmetric structural damping matrix K4representing local departures from γ, FRis a reduced form of a matrix F, and Y is a matrix having a plurality of vectors corresponding to the plurality of load vectors acting on the structure and included in the matrix F.
REFERENCES:
patent: 5233540 (1993-08-01), Andersson et al.
patent: 5686667 (1997-11-01), McCollum et al.
patent: 5777236 (1998-07-01), Walls
patent: 6779404 (2004-08-01), Brincker et al.
Board of Regents , The University of Texas System
Schwegman Lundberg Woessner & Kluth P.A.
Wachsman Hal
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