Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-06-30
1991-05-07
Wieder, Kenneth
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324649, G01R 2700
Patent
active
050140124
ABSTRACT:
For measuring the inductance of a workpiece, a device which includes an inductance meter, respective D.C. and A.C. power sources as well as a guard line circuit. In order to simulate conditions of actual use of the workpiece, the D.C. power source is connected to provide a direct current bias through the workpiece. A measuring current produced by the A.C. power source and applied to the workpiece is detected via the inductance meter. The guard line circuit is coupled so as to prevent any portions of the A.C. measuring signal from undesirably flowing through the D.C. power source.
REFERENCES:
patent: 3378765 (1968-04-01), Hilsenrath et al.
patent: 3519923 (1990-07-01), Martin
patent: 4467275 (1984-08-01), Maeda et al.
Kuboyama Yoichi
Yanagawa Koichi
Hewlett-Packard Co.
Regan Maura K.
Wieder Kenneth
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