Coating processes – Coating by vapor – gas – or smoke – Mixture of vapors or gases utilized
Reexamination Certificate
2004-05-21
2008-12-09
Chen, Bret (Department: 1792)
Coating processes
Coating by vapor, gas, or smoke
Mixture of vapors or gases utilized
C427S255394
Reexamination Certificate
active
07462376
ABSTRACT:
A CVD method for forming a silicon nitride film includes exhausting a process chamber (8) that accommodates a target substrate (W), and supplying a silane family gas (HCD) and ammonia gas (NH3) into the process chamber, thereby forming a silicon nitride film on the target substrate by CVD. Said forming a silicon nitride film on the target substrate alternately includes a first period of performing supply of the silane family gas (HCD) into the process chamber (8), and a second period of stopping supply of the silane family gas.
REFERENCES:
patent: 4091169 (1978-05-01), Bohg et al.
patent: 4158717 (1979-06-01), Nelson
patent: 4395438 (1983-07-01), Chiang
patent: 4699825 (1987-10-01), Sakai et al.
patent: 5052339 (1991-10-01), Vakerlis et al.
patent: 5562952 (1996-10-01), Nakahigashi et al.
patent: 5874368 (1999-02-01), Laxman et al.
patent: 5932286 (1999-08-01), Beinglass et al.
patent: 6391803 (2002-05-01), Kim et al.
patent: 6504233 (2003-01-01), Gorczyca et al.
patent: 6638879 (2003-10-01), Hsieh et al.
patent: 6686271 (2004-02-01), Raaijmakers et al.
patent: 6844273 (2005-01-01), Kato et al.
patent: 7094708 (2006-08-01), Kato et al.
patent: 7156923 (2007-01-01), Kato et al.
patent: 7351668 (2008-04-01), Chou et al.
patent: 2002/0058107 (2002-05-01), Fareed et al.
patent: 2006/0019032 (2006-01-01), Wang et al.
patent: 2006/0182885 (2006-08-01), Lei et al.
patent: 2008/0063791 (2008-03-01), Hasebe et al.
patent: 1-195277 (1989-08-01), None
patent: 2-93071 (1990-04-01), None
patent: 4-42931 (1992-02-01), None
patent: 6-275608 (1994-09-01), None
patent: 2001-168092 (2001-06-01), None
patent: 2002-305242 (2002-10-01), None
Liu, Xuejian, et al., “Chemical vapor deposition of silicon nitride thin films from tris(diethylamino)chlorosilane”. Materials Letters vol. 59, Issue 1, Jan. 2005, pp. 11-14.
Fukushima Kohei
Hiraka Junya
Kato Hitoshi
Yonezawa Masato
Chen Bret
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
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