Coating apparatus – Gas or vapor deposition – With treating means
Patent
1985-08-05
1987-02-03
Bueker, Richard
Coating apparatus
Gas or vapor deposition
With treating means
118723, C23C 1304
Patent
active
046402241
ABSTRACT:
Chemical vapor deposition on a semiconductor wafer is obtained in a plasma reactor having a plurality of lamps for radiantly heating the wafer. Calibrated temperature sensing means remote from the wafer is used to control the heating of the wafer. Gases are supplied by way of a plurality of tubes extending radially inwardly from the sides of the chamber. A baffle is provided to form an antechamber which aids in the uniformity of the deposition. The plasma is ignited for less than the whole deposition cycle for deposition of tungsten disilicide.
REFERENCES:
patent: 3623712 (1971-11-01), McNeilly
patent: 4101759 (1978-07-01), Anthony
patent: 4298629 (1981-11-01), Nozaki
patent: 4504730 (1985-03-01), Shimizu
Bunch Matthew L.
Price J. B.
Stitz Robert W.
Bueker Richard
Spectrum CVD, Inc.
Wille Paul F.
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