Cutting line measuring apparatus

Details Cutting line measuring apparatus Cutting line measuring apparatus

1995-07-07

1998-01-20

Boudreau, Leo

Image analysis

Applications

Manufacturing or product inspection

382316, 382141, G06K 900, G06K 930

Patent

active

057108250

ABSTRACT:
An apparatus for measuring a cutting line having a first end and a second end comprises a photographic device for photographing an image signal of the cutting line, and a processing device having a conversion function for converting the image signal of the cutting line into binary image data, first and second contour tracing functions, and a judging function. The first contour tracing function traces the contour of the cutting line from the first end to the second end of the cutting line based on the binary image data and outputs first contour tracing data corresponding to the contour of the cutting line. The second contour tracing function traces the contour of the cutting line from the second end to the first end of the cutting line based on the binary image data and outputs second contour tracing data corresponding to the contour of the cutting line. The judging function judges an abnormality in the traced contour of the cutting line by comparing the first contour tracing data to the second contour tracing data.

REFERENCES:
patent: 5373150 (1994-12-01), Koike et al.
patent: 5384905 (1995-01-01), Tanaka et al.
patent: 5412742 (1995-05-01), Takasaki et al.

Affiliated with

Also associated with

Rating

Cutting line measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Cutting line measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Cutting line measuring apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-731316