Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2007-10-15
2009-11-24
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C356S334000, C359S570000
Reexamination Certificate
active
07623235
ABSTRACT:
The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (CCGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. In the invention, the location of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or output slit (or output waveguide) even with large beam diffraction angle from the entrance slit or input slit (or input waveguide). The second one being specific for a particular design goal of a curved-grating spectrometer. In an embodiment, elliptical mirrors each with focal points at the slit and detector are used for each groove to obtain aberration-free curved mirrors.
REFERENCES:
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patent: 5114231 (1992-05-01), Gautherin et al.
patent: 9916701 (2001-07-01), Ooi et al.
patent: 6339662 (2002-01-01), Koteles et al.
Chang Seongsik
Ho Seng-Tiong
Huang Yingyan
Andrus Sceales Starke & Sawall LLP
Chowdhury Tarifur
Cook Jonathon D
Ho Seng-Tiong
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