Curved conduit ion sampling device and method

Details Curved conduit ion sampling device and method Curved conduit ion sampling device and method

2006-04-05

2008-09-09

Berman, Jack I. (Department: 2881)

Radiant energy

Ionic separation or analysis

With sample supply means

C250S281000, C250S282000, C250S284000, C250S287000, C250S42300F, C250S42300F, C250S424000, C250S425000, C250S426000, C250S252100, C250S304000

Reexamination Certificate

active

07423261

ABSTRACT:
An ion sampling apparatus for use in a mass spectrometry system. The ion sampling apparatus includes a target support for receiving a sample, an irradiation source for emitting energetic radiation or particles toward the target support, and a conduit having a curved end and a longitudinal axis, the curved end having an inlet with a central axis, the conduit being adjacent to the target support. The longitudinal axis of the conduit and the central axis of the inlet intersect to define an angle that is between about 20 degrees and about 210 degrees.

REFERENCES:
patent: 6621076 (2003-09-01), van de Goor et al.
patent: 7078681 (2006-07-01), Fischer et al.

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