Curvature correction

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Details

364498, 356325, G06F 1520, G01J 342

Patent

active

042388309

ABSTRACT:
In a dual beam atomic absorption spectrometer having a dedicated microcomputer, improved calibration constants are obtained from either two or three known concentration values by finding a number of constants equal to the number of samples such that when the excess over one of the absorbance of that sample of known concentration multiplied by a second constant is divided into the first constant times the absorbance raised to a power one less than the number of samples or in the case of three samples the difference between that value and a third constant times the absorbance, for each measured sample, the result is equal to the known concentration of the sample.

REFERENCES:
patent: 2847899 (1958-08-01), Walsh
patent: 3469438 (1969-09-01), Gaumer
patent: 3721813 (1973-03-01), Condon et al.
patent: 3734621 (1973-05-01), Moody et al.
patent: 3868499 (1975-02-01), Aaronson et al.
patent: 3922091 (1975-11-01), Suva et al.
patent: 3927944 (1975-12-01), Iwahashi et al.
patent: 3972617 (1976-08-01), Shibata et al.

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