Current test probe having a solder guide portion, and...

Details Current test probe having a solder guide portion, and... Current test probe having a solder guide portion, and...

2011-02-15

2011-02-15

Tang, Minh N (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754030

Reexamination Certificate

active

07888958

ABSTRACT:
A probe for current test is provided. The probe includes a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board, a solder layer formed on at least one side face of said connection portion, and a guide portion formed on the connection portion. The guide portion penetrates the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face. When the solder layer is melted, the guide portion guides a portion of the melted solder to the other side face.

REFERENCES:
patent: 5453017 (1995-09-01), Belopolsky
patent: 2002/0060580 (2002-05-01), Yamabe
patent: 2002/0061668 (2002-05-01), Fujimura
patent: 2002/0146920 (2002-10-01), Sugiyama
patent: 2005-055194 (2002-03-01), None
patent: 2002-158264 (2002-05-01), None
patent: 2002-164104 (2002-06-01), None
patent: 2002-283049 (2002-10-01), None
Pat. Abstract of JP (2002-164104), Jun. 7, 2002, Ando Electric Co. Ltd.
Pat. Abstract of JP (2002-283049), Oct. 2, 2002, Ando Electric Co. Ltd.
Pat. Abstract of JP (2002-158264), May 31, 2002, Ando Electric Co. Ltd.
Pat. Abstract of JP (2005-055194), Mar. 3, 2002, Japan Electronic Materials Corp.

Affiliated with

Also associated with

Rating

Current test probe having a solder guide portion, and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Current test probe having a solder guide portion, and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Current test probe having a solder guide portion, and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2626998