Current sensor including an integrated circuit die including...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Magnetic saturation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S126000

Reexamination Certificate

active

07990132

ABSTRACT:
A current sensor includes a coils located within the integrated circuit die and inductively coupled to a conductor located in the integrated circuit package holding the die. The inductors sense the current in the conductor and supply the sensed signal to an integrator that supplies a voltage indicative of the current in the conductor.

REFERENCES:
patent: 4176374 (1979-11-01), Eames
patent: 4240059 (1980-12-01), Wolf et al.
patent: 4536706 (1985-08-01), Kemper
patent: 4691338 (1987-09-01), Makino
patent: 4926116 (1990-05-01), Talisa
patent: 4931725 (1990-06-01), Hutt et al.
patent: 4939541 (1990-07-01), Sugiura
patent: 5015945 (1991-05-01), Radun
patent: 5032785 (1991-07-01), Mathis et al.
patent: 5070317 (1991-12-01), Bhagat
patent: 5124648 (1992-06-01), Webb et al.
patent: 5128611 (1992-07-01), Konrad
patent: 5478773 (1995-12-01), Dow et al.
patent: 5696441 (1997-12-01), Mak et al.
patent: 5717327 (1998-02-01), Bradford
patent: 5815391 (1998-09-01), Pelly
patent: 5952704 (1999-09-01), Yu et al.
patent: 5963038 (1999-10-01), De Jong et al.
patent: 5986341 (1999-11-01), Usami et al.
patent: 6054329 (2000-04-01), Burghartz et al.
patent: 6061224 (2000-05-01), Allen
patent: 6069397 (2000-05-01), Cornett et al.
patent: 6097203 (2000-08-01), Parker et al.
patent: 6169680 (2001-01-01), Matsui et al.
patent: 6271655 (2001-08-01), Weber et al.
patent: 6274920 (2001-08-01), Park et al.
patent: 6291872 (2001-09-01), Wang et al.
patent: 6356068 (2002-03-01), Steiner et al.
patent: 6384478 (2002-05-01), Pour
patent: 6414475 (2002-07-01), Dames et al.
patent: 6577115 (2003-06-01), Carpenter
patent: 6608361 (2003-08-01), Chang et al.
patent: 6661231 (2003-12-01), Arai et al.
patent: 6781359 (2004-08-01), Stauth et al.
patent: 6791341 (2004-09-01), Shenai et al.
patent: 6828770 (2004-12-01), McCauley et al.
patent: 6835576 (2004-12-01), Matsuzaki et al.
patent: 6894478 (2005-05-01), Fenske
patent: 6964918 (2005-11-01), Fan et al.
patent: 6972658 (2005-12-01), Findley et al.
patent: 6987307 (2006-01-01), White et al.
patent: 7118925 (2006-10-01), Brennan et al.
patent: 7196397 (2007-03-01), Chiola et al.
patent: 7203047 (2007-04-01), Holce et al.
patent: 7227240 (2007-06-01), Knapp et al.
patent: 7239123 (2007-07-01), Rannow et al.
patent: 7268409 (2007-09-01), Tseng et al.
patent: 7292400 (2007-11-01), Bishop
patent: 7362086 (2008-04-01), Dupuis et al.
patent: 7397234 (2008-07-01), Alfano et al.
patent: 7400025 (2008-07-01), Pitts et al.
patent: 7453142 (2008-11-01), Lee et al.
patent: 2002/0105080 (2002-08-01), Speakman
patent: 2003/0098505 (2003-05-01), Kimura et al.
patent: 2004/0021218 (2004-02-01), Hayama et al.
patent: 2004/0263148 (2004-12-01), Takabatake
patent: 2005/0003562 (2005-01-01), Bhatt et al.
patent: 2005/0007296 (2005-01-01), Endo et al.
patent: 2005/0030018 (2005-02-01), Shibahara et al.
patent: 2005/0103112 (2005-05-01), Pedersen et al.
patent: 2005/0134254 (2005-06-01), Roden et al.
patent: 2005/0156587 (2005-07-01), Yakymyshyn et al.
patent: 2005/0285262 (2005-12-01), Knapp et al.
patent: 2006/0020371 (2006-01-01), Ham et al.
patent: 2006/0038552 (2006-02-01), Omura et al.
patent: 2006/0044088 (2006-03-01), Vaitkus et al.
patent: 2006/0152323 (2006-07-01), Pavier
patent: 2006/0181385 (2006-08-01), Hurley
patent: 2007/0018298 (2007-01-01), Gamand
patent: 2007/0072340 (2007-03-01), Sanzo et al.
patent: 2007/0114651 (2007-05-01), Marimuthu et al.
patent: 2007/0139032 (2007-06-01), Dupuis et al.
patent: 2007/0139066 (2007-06-01), Dupuis et al.
patent: 2007/0139835 (2007-06-01), Alfano et al.
patent: 2008/0136399 (2008-06-01), Alfano et al.
patent: 2008/0157272 (2008-07-01), Tanaka
patent: 1498916 (2005-01-01), None
patent: W002082109 (2002-10-01), None
“1- and 2-Axis Magnetic Sensors HMC1001/1002, HMC1021/1022,” Honeywell Sensor Products Data Sheet, Rev. B, Apr. 2000, 15 pages.
ACS704 Data Sheet, Allegro Microsystems, Inc., (date prior to Oct. 9, 2005 email listing reference) 2 pages.
ACS704ELC-015 Data Sheet, Allegro MicroSystems, Inc. Rev. 6, 2005, 19 pages.
“Battery Powered Current Sensor” Ask the Engineer, Honeywell Solid State Electronics Center, 2003, 1 page.
Friedrich, Andreas P., and Lemme, Helmuth, “The Universal Current Sensor,” Sensors magazine, May 1, 2000, 12 pages.
Jingsheng, Liao et al., “Studies of Rogowski Coil Current Transducer for Low Amplitude Current (100A) Measurement,” IEEE CCECE 2003 Canadian Conference on Electrical and Computer Engineering, vol. 1, May 4-7, 2003, 5 pages.
Jingsheng, Liao et al., “Studies of Rogowski Coil Current Transducer for Low Amplitude Current (100A) Measurement,” IEEE CCECE 2003 Canadian Conference on Electrical and Computer Engineering, vol. 1, May 4-7, 2003, 5 pages.
Koon, William, “Current Sensing for Energy Metering,” in Conference Proceedings IIC-China/ESC-China 2002, pp. 321-324, 2002.
“Magnetic Current Sensing,” AN-209, Honeywell Solid State Electronics Center, Apr. 2000, 7 pages.
Ward, D. A. and Exon, J. La T., “Using Rogowski Coils for Transient Current Measurements,” Engineering Science and Education Journal, Jun. 1993, 9 pages.
U.S. Appl. No. 11/311,517, filed Dec. 19, 2005, entitled, “Integrated Current Sensor Package,” naming inventors Timothy J. Dupuis and John Pavelka.
Nakura, Toru et al., University of Tokyo, Tokyo, Japan, “On-chip di/dt Detector IP for Power Supply,” D and R Headline News, 2003, www.design-reuse.com, pp. 1-9 .
Non-Final Office Action mailed Dec. 15, 2006 in U.S. Appl. No. 11/311,603, 12 pages.
Final Office Action mailed May 31, 2007 in U.S. Appl. No. 11/311,603, 13 pages.
Notice of Allowance mailed Jan. 16, 2008 in U.S. Appl. No. 11/311,603, 6 pages.
Non-Final Office Action mailed Nov. 23, 2007 in U.S. Appl. No. 11/311,517, 9 pages.
Non-Final Office Action mailed May 16, 2008 in U.S. Appl. No. 11/311,517, 7 pages.
Non-Final Office Action mailed Dec. 8, 2008 in U.S. Appl. No. 11/311,517, 8 pages.
Notice of Allowance mailed Jun. 18, 2009 in U.S. Appl. No. 11/311,517, 9 pages.
Examination Report dated Jun. 23, 2010, from Chinese Application No. 200680053050.X (national entry of PCT/US2006/048325).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Current sensor including an integrated circuit die including... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Current sensor including an integrated circuit die including..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Current sensor including an integrated circuit die including... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2760746

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.