Current sense circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

327541, G01R 3128, G05F 110

Patent

active

060284382

ABSTRACT:
A current sense circuit for use in a semiconductor tester has a voltage source for forcing a voltage to a first node of the current sense circuit, a current sense resistor having a first terminal connected to the first node and a second terminal connected to a second node for connection to a pin of a device under test (DUT), and a differential amplifier for measuring voltage drop across the current sense resistor. The current sense resistor is composed of a network of switchable semiconductor resistor devices each having at least a first resistance state and a second resistance state, in which the resistor device has first and second different resistance values respectively, and a device for selectively controlling the states of the resistor devices, whereby the resistance value of the current sense resistor can be selectively varied.

REFERENCES:
patent: 4855685 (1989-08-01), Hochschild
patent: 5254883 (1993-10-01), Horowitz et al.
patent: 5506541 (1996-04-01), Herndon
patent: 5844913 (1998-12-01), Hassoun et al.

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