Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Reexamination Certificate
2006-06-05
2008-10-21
Wells, Kenneth B. (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
With specific source of supply or bias voltage
C327S543000, C323S909000, C323S909000, C323S909000, C323S909000, C330S288000
Reexamination Certificate
active
07439796
ABSTRACT:
A current mirror circuit that allows for over voltage stress testing includes: a first transistor; a second transistor having a gate coupled to a gate of the first transistor; a switch coupled between the gate of the first transistor and the drain of the first transistor; a bias source coupled to a control node of the switch such that the switch is ON during normal current mirror operation, and the switch is OFF during over voltage stress testing; and a clamp coupled between the control node of the switch and a source node.
REFERENCES:
patent: 4853610 (1989-08-01), Schade, Jr.
patent: 5864247 (1999-01-01), Hirano et al.
patent: 6404275 (2002-06-01), Voldman et al.
patent: 6864702 (2005-03-01), Teggatz et al.
Adams Reed Wilburn
Atrash Amer Hani
Brady W. James
Cole Brandon S
Stewart Alan K.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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