Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-31
2007-07-31
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
11022800
ABSTRACT:
A current mirror multi-channel leakage monitor circuit and method measures die leakage and generates digital keeper control bits to control a process compensated dynamic circuit. The leakage monitor enables high resolution on-chip leakage measurements in multiple locations on a die, thereby saving test time and enabling both die to die and within die process compensation.
REFERENCES:
patent: 5570034 (1996-10-01), Needham et al.
patent: 5654895 (1997-08-01), Bach et al.
patent: 6177827 (2001-01-01), Ota
patent: 6246243 (2001-06-01), Audy
patent: 6469489 (2002-10-01), Bourquin et al.
Hsu Steven K.
Kim Chris Hyung-il
Krishnamurthy Ram
Ked & Associates LLP
Nguyen Ha Tran
Nguyen Tung X.
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