Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-01-18
2005-01-18
Pert, Evan (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06844750
ABSTRACT:
A current mirror multi-channel leakage monitor circuit and method measures die leakage and generates digital keeper control bits to control a process compensated dynamic circuit. The leakage monitor enables high resolution on-chip leakage measurements in multiple locations on a die, thereby saving test time and enabling both die to die and within die process compensation.
REFERENCES:
patent: 6177827 (2001-01-01), Ota
patent: 6246243 (2001-06-01), Audy
patent: 6469489 (2002-10-01), Bourquin et al.
Hsu Steven K.
Kim Chris Hyung-il
Krishnamurthy Ram
Fleshner & Kim LLP
Intel Corporation
Nguyen Tung X.
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