Current measuring structure for testing integrated circuits

Details Current measuring structure for testing integrated circuits Current measuring structure for testing integrated circuits

1993-09-30

1996-01-09

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324126, G01R 3100

Patent

active

054831733

ABSTRACT:
A measuring structure includes a first resistor for converting a current to be measured into a voltage, and an operational amplifier for measuring the current. A second resistor connected in series to, and integrated with, the first resistor, is activated by an input terminal solely at the wafer testing stage, to reduce, in relation to the nominal value, the current corresponding to a predetermined voltage value detected by the operational amplifier, and to enable optimum correlation of the reduced current value obtainable during wafer testing and the corresponding nominal current value.

REFERENCES:
patent: 2874354 (1959-02-01), Bell
patent: 3772595 (1973-11-01), DeWolf et al.
patent: 4442397 (1984-04-01), Ishikawa et al.
patent: 4623950 (1986-11-01), Palara et al.
Electronic Components & Applications, vol. 10, No. 1, Oct. 1990. Einhoven, NL, pp. 53-58, XP000229355. Humphreys "Introducing the Philips Sensorfet".
Forrest M. Mims, III "Getting Started in Electronics"1983, p. 107, Radio-Shack Catalog No. 276-5003.

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