Current measurement circuit comprising a mutually coupled transf

Details Current measurement circuit comprising a mutually coupled transf Current measurement circuit comprising a mutually coupled transf

1995-05-19

1996-11-12

Tokar, Michael

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324142, G01R 2726

Patent

active

055743803

ABSTRACT:
A current measurement circuit comprising a mutual inductance transformer 3, an integration circuit 2, and a dither circuit 1 which adds a square wave to the signal from the transformer 3 before the input of the integration circuit 2 in order that the integration circuit 2 provides a signal representing the measured current perturbed by a triangular dither signal.

REFERENCES:
patent: 4255707 (1981-03-01), Miller
patent: 4467320 (1984-08-01), McPhee
patent: 5180979 (1993-01-01), Frazzini et al.
patent: 5265267 (1993-11-01), Martin et al.
Patent Abstracts of Japan, vol. 18, No. 420 (P-1782), Aug. 5, 1994 & JP-A-06 130 098 (Mitsubishi Electric) May 13, 1994.

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