Patent
1974-05-28
1976-10-26
Wojciechowicz, Edward J.
357 60, 357 37, 357 46, 357 88, 357 89, 357 90, H01L 29167, H01L 2900, H01L 2702, H01L 2904
Patent
active
039887723
ABSTRACT:
The minority carrier lifetime is drastically reduced in an integrated semiconductor power device by introducing deep level impurities such, for example, as gold, silver, platinum, nickel and copper into selected regions of the device by Thermal Gradient Zone Melting processing.
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patent: 3513367 (1970-05-01), Wolley
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patent: 3775196 (1973-11-01), Wakamiya et al.
Cohen Joseph T.
General Electric Company
Squillaro Jerome C.
Winegar Donald M.
Wojciechowicz Edward J.
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