Chemistry: molecular biology and microbiology – Apparatus – Including measuring or testing
Reexamination Certificate
2011-03-22
2011-03-22
Beisner, William H (Department: 1775)
Chemistry: molecular biology and microbiology
Apparatus
Including measuring or testing
C435S303100, C359S395000, C359S398000
Reexamination Certificate
active
07910355
ABSTRACT:
A culture observation apparatus, which is used for observing a cultured cell while culturing the cell, includes a culture device that cultures the cultured cell, and a microscope used for observing the cultured cell. The culture device includes a first space that is controlled to an environment suitable for culture of the cell, and a second space that is controlled to a lower humidity condition in comparison with the first space. The microscope includes an objective optical unit including an objective lens; the objective optical unit having at least one portion located in the second space, and another portion extending into the first space through an opening formed in a partition wall that separates the first space and the second space, with a gap between the objective optical unit and the partition wall being sealed by a sealing member, and the objective lens includes a plurality of lens groups, with mutual spaces among the lens groups vented to the second space.
REFERENCES:
patent: 832219 (1906-10-01), Spear
patent: 4090921 (1978-05-01), Sawamura et al.
patent: 4629862 (1986-12-01), Kitagawa et al.
patent: 5859727 (1999-01-01), Tsuchiya
patent: 6170167 (2001-01-01), Kato
patent: 2001/0028443 (2001-10-01), Yabu
patent: 2005/0105172 (2005-05-01), Hasegawa et al.
patent: 2005/0248836 (2005-11-01), Tsuchiya
patent: 1 548 484 (2005-06-01), None
patent: 1 553 166 (2005-07-01), None
patent: 3-57744 (1991-09-01), None
patent: 2592712 (1999-01-01), None
patent: 11-133307 (1999-05-01), None
patent: 2001-092000 (2001-04-01), None
patent: 2001-350099 (2001-12-01), None
patent: WO 2004/021066 (2004-03-01), None
Endo Hideaki
Hasegawa Kazuhiro
Hirano Ryuichi
Kagayama Akitsugu
Koyama Ken-ichi
Beisner William H
Henkel Danielle
Holtz Holtz Goodman & Chick PC
Olympus Corporation
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