Cu interconnects with composite barrier layers for...

Details Cu interconnects with composite barrier layers for... Cu interconnects with composite barrier layers for...

2005-10-04

2005-10-04

Huynh, Andy (Department: 2818)

Active solid-state devices (e.g., transistors, solid-state diode

Combined with electrical contact or lead

Of specified material other than unalloyed aluminum

C257S750000, C257S751000, C257S753000, C257S760000, C257S762000

Reexamination Certificate

active

06952052

ABSTRACT:
A composite α-Ta/ graded tantalum nitride /TaN barrier layer is formed in Cu interconnects with a structure designed for improved wafer-to-wafer uniformity, electromigration resistance and reliability, reduced contact resistance, and increased process margin. Embodiments include a dual damascene structure in a low-k interlayer dielectric comprising Cu and a composite barrier layer comprising an initial layer of TaN on the low-k material, a graded layer of tantalum nitride on the initial TaN layer and a continuous α-Ta layer on the graded tantalum nitride layer. Embodiments include forming the initial TaN layer at a thickness sufficient to ensure deposition of α-Ta, e.g., as at a thickness of bout 50 Å to about 100 Å. Embodiments include composite barrier layers having a thickness ratio of α-Ta and graded tantalum nitride: initial TaN of about 2.5:1 to about 3.5:1 for improved electromigration resistance and wafer-to-wafer uniformity.

REFERENCES:
patent: 6645853 (2003-11-01), Ngo et al.
patent: 2005/0098897 (2005-05-01), Edelstein et al.

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