CTS and inspecting method thereof

Details CTS and inspecting method thereof CTS and inspecting method thereof

2008-07-22

2010-10-19

Norris, Jeremy C (Department: 2841)

Electricity: conductors and insulators

Conduits, cables or conductors

Preformed panel circuit arrangement

C174S255000

Reexamination Certificate

active

07816608

ABSTRACT:
A substrate for inspecting a thickness of contacts at least includes a dielectric layer, a first metal layer, and a second metal layer. The first metal layer which includes a circuit region and a testing region is formed on an upper surface of the dielectric layer, and the circuit region has a plurality of contacts. The second metal layer which has a hollowed region is formed on a lower surface of the dielectric layer, and the hollowed region is aligned with the testing region of the first metal layer to avoid the interference when the testing region is inspected.

REFERENCES:
patent: 6023104 (2000-02-01), Koizumi et al.
patent: 6797345 (2004-09-01), Okamoto et al.
patent: 2006/0038280 (2006-02-01), Jang et al.
patent: 2006/0250451 (2006-11-01), Suzuki et al.

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