Crystallization apparatus and crystallization method

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Reexamination Certificate

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Reexamination Certificate

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07063478

ABSTRACT:
A crystallization apparatus includes a mask and an illumination system which illuminates the mask with a light beam, the light beam from the illumination system becoming a light beam having a light intensity distribution with an inverse peak pattern when transmitted through the mask, and irradiating a polycrystal semiconductor film or an amorphous semiconductor film, thereby generating a crystallized semiconductor film. The mask includes a light absorption layer having light absorption characteristics according to the light intensity distribution with the inverse peak pattern.

REFERENCES:
patent: 2002/0168577 (2002-11-01), Yoon
patent: 2004/0076894 (2004-04-01), Hwang
patent: 2004/0126674 (2004-07-01), Taniguchi et al.
Masakiyo Matsumura, “Preparation of Ultra-Large Grain Silicon Thin-Films by Excimer-Laser”, Surface Science, vol. 21, No. 5, 2000, pp. 278-287.
Mitsuru Nakata, et al., “A New Nucleation-Site-Control Excimer-Laser-Crystallization Method”, The Japan Society of Applied Physics, vol. 40, Part 1, No. 5A, May 2001, pp. 3049-3054.

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