Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2006-07-11
2006-07-11
Sample, David (Department: 1755)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S708000, C423S329100, C208S111010, C208S027000, C585S533000
Reexamination Certificate
active
07074384
ABSTRACT:
A new family of crystalline molecular sieves is described having a characteristic XRD pattern as illustrated in FIG.1,and having three sharp peaks at 2θ (CuKα) of 8.82, 12.44, and 23.01.
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Bons Antonie Jan
Jacobs Pierre August
Kirschhock Christine Eva Antiona
Martens Johan Adriaan
Mertens Machteld Maria
ExxonMobil Chemical Patents Inc.
Sample David
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