X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1986-04-15
1988-10-25
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 82, 428426, 428428, 428446, G21K 106
Patent
active
047808993
ABSTRACT:
A crystal for an X-ray analysis apparatus is mounted on a carrier of an amorphous material whose bonding surface preferably obtains its desired geometry by grinding and polishing. Using a suitably transparent carrier, use can be made of a UV-curable type of adhesive which is irradiated through the carrier. The thickness of the layer of glue can be checked, if desired, via the same path. Because no disturbing background radiation is generated by an amorphous carrier, local irregularities are avoided, and better thermal adaptation of carrier and crystal material is feasible, such a crystal will contribute to a substantially higher resolution when used in an X-ray analysis apparatus.
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"Focusing X-ray Monochromators of Si and Ge Crystals" by Frey et al. Journal of Applied Crystallography, vol. 7, pt. 2, 4/1/74.
"Reflecting Variable Bent Crystal Spectrometer" by Elion et al., Rev. of Scientific Instruments, vol. 33, no. 7, 7/1962.
"Use of Toroidal Monochromators . . . Ratios" by Furnes, Jr. et al., Nuclear Instruments and Methods, vol. 193, (1982).
Adema Cornelis L.
Alting Cornelis L.
Gevers Wilhelmus H. J. M.
Huizing Albert
Church Craig E.
Freeman John C.
Miller Paul R.
U.S. Philips Corporation
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