Crystal defects analyzer

Details Crystal defects analyzer Crystal defects analyzer

1981-06-26

1984-05-15

Punter, William H.

Optics: measuring and testing

For optical fiber or waveguide inspection

73607, 73643, 356237, 367165, G01N 2100, G01N 2904

Patent

active

044485255

ABSTRACT:
A crystal defect analyzer comprises acousto-electric transducer means disposed in close adherence to a sample to be analyzed through the medium of a filter layer which functions to intercept light or electrons or particles emitted from said excitation means and to transmit only acoustic waves produced within said sample by excitation, thereby it can attain higher response and sensitivity, smaller size, higher resistance to vibration and superior operationality.

REFERENCES:
patent: 2711646 (1955-06-01), Mendousse
patent: 2885887 (1959-05-01), Hanysz
patent: 2912853 (1959-11-01), Hanysz
patent: 3126579 (1964-03-01), Janszen
patent: 3431462 (1969-03-01), Muenow et al.
patent: 3903733 (1975-09-01), Murayama et al.
patent: 4276780 (1981-07-01), Patel et al.
Gutfeld et al., "20-MHz Acoustic Waves from Pulsed Thermoelastic Expansions of Constrained Surfaces", Appl. Phys. Letts. 3-1977, pp. 257-258.
Rosencwaig et al., "Photoacoustic Study of Laser Damage in Thin Films", Appl. Phys. Lett. 4-1980, pp. 667-669.
Busse et al., "Subsurface Imaging with Photoacoustics" Appl. Phys. Lett. 36(10) May 15, 1980, pp. 815-816.
Farrow et al., "Piezoelectric Detection of Photoacoustic Signals" App. Optics, 4-1-78, pp. 1093-1098.

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