Cryogenic density and mass-flow measurement system

Details Cryogenic density and mass-flow measurement system Cryogenic density and mass-flow measurement system

1988-02-01

1989-05-30

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

7336102, 7336103, 73 32R, 364558, G01R 2726, G01N 900

Patent

active

048354562

ABSTRACT:
A cryogenic density and mass-flow measurement system incorporating a high-speed microprocessor-based cryogenic fluid density instrumentation that is based on the rigorous application of the molecular dielectric theory, using a dielectric susceptibility function in the application of the Clausinus-Mossotti formula, and the introduction of the quantitation of a new susceptibility parameter k which serves to bridge the gap between the theoretically rigorous molecular dielectric equation and the macroscopic dielectric equation. The operating principle is formulated on a differential dielectric measurement approach with a new algorithm which provides for automatic adjustments for polarizability and stray capacitance changes. High precision digital density measurement is achieved over a wide range of cryogenic fluid states ranging from supercritical through subcritical to the slush phase.

REFERENCES:
patent: 3421077 (1969-01-01), Liu et al.
patent: 3839909 (1974-10-01), Sander
patent: 3933030 (1976-01-01), Forster et al.

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