Crosstalk suppression in wireless testing of semiconductor...

Details Crosstalk suppression in wireless testing of semiconductor... Crosstalk suppression in wireless testing of semiconductor...

2011-03-29

2011-03-29

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762030, C324S762050

Reexamination Certificate

active

07915908

ABSTRACT:
An integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, wherein circuitry for setting a selected radio communication frequencies to be used for the wireless test of the integrated circuit are integrated on the semiconductor material die.

REFERENCES:
patent: 6161205 (2000-12-01), Tuttle
patent: 6759863 (2004-07-01), Moore
patent: 7257504 (2007-08-01), Bolander et al.
patent: 7262996 (2007-08-01), Cheung
patent: 7336174 (2008-02-01), Maloney
patent: 7417449 (2008-08-01), Posey et al.
patent: 2005/0138499 (2005-06-01), Pileggi et al.

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