Image analysis – Pattern recognition
Reexamination Certificate
2006-04-04
2006-04-04
Shah, Sanjiv (Department: 2627)
Image analysis
Pattern recognition
C382S165000, C382S275000, C600S306000, C600S340000
Reexamination Certificate
active
07024037
ABSTRACT:
A process for measuring skin ashing is provided. The process comprises selecting a desired skin testing area and acguiring an image of the area using x-polarization technique. The image is analyzed by obtaining a light distributing image, storing the difference between this image and the original image and using a differential in intensity to define ashing.
REFERENCES:
patent: 4398541 (1983-08-01), Pugliese
patent: 4412246 (1983-10-01), Allen et al.
patent: 5005975 (1991-04-01), Kawai et al.
patent: 5016173 (1991-05-01), Kenet et al.
patent: 5028138 (1991-07-01), Wolff
patent: 5101101 (1992-03-01), Sawamura
patent: 5198875 (1993-03-01), Bazin et al.
patent: 5343536 (1994-08-01), Groh
patent: 5669868 (1997-09-01), Markoll
patent: 5742392 (1998-04-01), Anderson et al.
patent: 5828339 (1998-10-01), Patel
patent: 5828451 (1998-10-01), Bellus et al.
patent: 5836872 (1998-11-01), Kenet et al.
patent: 5986746 (1999-11-01), Metz et al.
patent: 6032071 (2000-02-01), Binder
patent: 6160579 (2000-12-01), Shiraiwa et al.
patent: 6175750 (2001-01-01), Cook et al.
patent: 6208749 (2001-03-01), Gutkowicz-Krusin et al.
patent: 6215893 (2001-04-01), Leshem et al.
patent: 6324417 (2001-11-01), Cotton
patent: 6418339 (2002-07-01), Essenpreis et al.
patent: 6436127 (2002-08-01), Anderson et al.
patent: 6452188 (2002-09-01), Chubb
patent: 6587711 (2003-07-01), Alfano et al.
patent: 6740868 (2004-05-01), Knebel et al.
patent: 6907193 (2005-06-01), Kollias et al.
patent: 6949115 (2005-09-01), Mascio
patent: 2003/0179929 (2003-09-01), Zhang et al.
patent: 1 167 950 (2002-01-01), None
patent: 2 784 018 (2000-04-01), None
patent: 2 147 421 (1985-05-01), None
patent: 99/37980 (1999-07-01), None
Anderson RR., “Polarized light examination and Photography of th eskin”, Jul. 1991, Arch Dermatol, 127 (7), 1000-5.
Paul Debevec et al., “Acquiring the Reflectance Field of a Human Face”, SIGGRAPH 2000 Conference Proceedings, 145-156.
S. L. Jacques et al., “Imaging skin with polarized light”, Oct. 23-26, 2002, Proceedings of the Second Joint EMBS/BMES Conferencee, 2314-2315.
j. Philip et al., “Improved Optical Discrimination of Skin with Polorized Light”, J. Soc. Cosmet. Chem., 39, 121-132 (1988).
International Search ReportNo. EP 0301660 dated Sep. 17, 2003—3 pages.
Krishnan Srinivasan
Santanastasio Helene
Shah Pravin
Tsaur Liang Sheng
Zhang Xiaodong
Desire Gregory
Koatz Ronald A.
Shah Sanjiv
Unilever Home & Personal Care USA, a division of Conopco, I
LandOfFree
Cross-polarized imaging method for measuring skin ashing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Cross-polarized imaging method for measuring skin ashing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Cross-polarized imaging method for measuring skin ashing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3525735